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Test structure implementation document DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs)

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Published by U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O. in Gaithersburg, MD, Washington .
Written in English

Subjects:

  • Microwave integrated circuits -- Design -- Data processing,
  • Gallium arsenide semiconductors -- Design -- Data processing,
  • Computer-aided design

Book details:

Edition Notes

StatementC.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory
SeriesNIST special publication, Semiconductor measurement technology
ContributionsUnited States. Defense Advanced Research Projects Agency, Wright Laboratory (Wright-Patterson Air Force Base, Ohio), National Institute of Standards and Technology (U.S.)
The Physical Object
FormatMicroform
Paginationiv, 88 p.
Number of Pages88
ID Numbers
Open LibraryOL13619024M
OCLC/WorldCa34871880

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